发明授权
US08341518B2 Report format setting method and apparatus, and defect review system
有权
报告格式设定方法和设备,缺陷审查系统
- 专利标题: Report format setting method and apparatus, and defect review system
- 专利标题(中): 报告格式设定方法和设备,缺陷审查系统
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申请号: US12901954申请日: 2010-10-11
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公开(公告)号: US08341518B2公开(公告)日: 2012-12-25
- 发明人: Takehiro Hirai
- 申请人: Takehiro Hirai
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2006-052620 20060228
- 主分类号: G06F17/00
- IPC分类号: G06F17/00
摘要:
Generated is a template edition screen on which to display components of a report as modules by OSD by use of icons. One of the icons is selected by use of a pointing device including a mouse. By a drag-and-drop operation, the icon is placed at a desired position in an output format setup area formed in the same screen. The icon is set in a desired size by another drag-and-drop operation. Details of a module shown by the icon thus placed can be set up in a detail setup area in the same screen. Information on a format thus set up is retained as a template through a retention function, and accordingly can be used easily by simply calling the information. Moreover, the retained template can be edited as well. This makes it possible not only to create a new template, but also to modify an existing template.
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