Invention Grant
US08294095B2 Apparatus of plural charged particle beams with multi-axis magnetic lens
有权
具有多轴磁性透镜的多个带电粒子束的装置
- Patent Title: Apparatus of plural charged particle beams with multi-axis magnetic lens
- Patent Title (中): 具有多轴磁性透镜的多个带电粒子束的装置
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Application No.: US12968201Application Date: 2010-12-14
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Publication No.: US08294095B2Publication Date: 2012-10-23
- Inventor: Zhongwei Chen , Weiming Ren , Kenichi Kanai , Xuedong Liu
- Applicant: Zhongwei Chen , Weiming Ren , Kenichi Kanai , Xuedong Liu
- Applicant Address: TW Hsin-Chu
- Assignee: Hermes Microvision, Inc.
- Current Assignee: Hermes Microvision, Inc.
- Current Assignee Address: TW Hsin-Chu
- Agency: Stout, Uxa, Buyan & Mullins, LLP
- Main IPC: H01J29/56
- IPC: H01J29/56 ; G01N23/225

Abstract:
An apparatus basically uses a simple and compact multi-axis magnetic lens to focus each of a plurality of charged particle beams on sample surface at the same time. In each sub-lens module of the multi-axis magnetic lens, two magnetic rings are respectively inserted into upper and lower holes with non-magnetic radial gap. Each gap size is small enough to keep a sufficient magnetic coupling and large enough to get a sufficient axial symmetry of magnetic scale potential distribution in the space near to its optical axis. This method eliminates the non-axisymmetric transverse field in each sub-lens and the round lens field difference among all sub-lenses at the same time; both exist inherently in a conventional multi-axis magnetic lens. In the apparatus, some additional magnetic shielding measures such as magnetic shielding tubes, plates and house are used to eliminate the non-axisymmetric transverse field on the charged particle path from each charged particle source to the entrance of each sub-lens and from the exit of each sub-lens to the sample surface.
Public/Granted literature
- US20120145900A1 APPARATUS OF PLURAL CHARGED PARTICLE BEAMS WITH MULTI-AXIS MAGNETIC LENS Public/Granted day:2012-06-14
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