发明授权
US08285013B2 Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns 有权
利用异常模式的过去位置检测诊断目标图像内的异常模式的方法和装置

  • 专利标题: Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns
  • 专利标题(中): 利用异常模式的过去位置检测诊断目标图像内的异常模式的方法和装置
  • 申请号: US12042465
    申请日: 2008-03-05
  • 公开(公告)号: US08285013B2
    公开(公告)日: 2012-10-09
  • 发明人: Yoshiyuki Moriya
  • 申请人: Yoshiyuki Moriya
  • 申请人地址: JP Tokyo
  • 专利权人: FUJIFILM Corporation
  • 当前专利权人: FUJIFILM Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Sughrue Mion, PLLC
  • 优先权: JP2007/054010 20070305
  • 主分类号: G06K9/00
  • IPC分类号: G06K9/00
Method and apparatus for detecting abnormal patterns within diagnosis target image utilizing the past positions of abnormal patterns
摘要:
An image processing apparatus having improved detection performance for detecting an abnormal shadow, such as a tumor, and reducing a burden on the user is disclosed. In the image processing apparatus, an aligning unit aligns a previous image and a current diagnosis image with each other, and a corresponding position calculating unit calculates a position on a subject in the current diagnosis image corresponding to the position of an abnormal shadow on the subject in the previous image based on positional information of the abnormal shadow on the subject in the previous image and alignment information. A current diagnosis image abnormal shadow detecting unit detects the abnormal shadow in the current diagnosis image from the vicinity of the corresponding position in the current diagnosis image.
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