Invention Grant
US08276029B2 System and method for using a memory mapping function to map memory defects
有权
使用内存映射函数映射内存缺陷的系统和方法
- Patent Title: System and method for using a memory mapping function to map memory defects
- Patent Title (中): 使用内存映射函数映射内存缺陷的系统和方法
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Application No.: US12753406Application Date: 2010-04-02
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Publication No.: US08276029B2Publication Date: 2012-09-25
- Inventor: Mukund P. Khatri , Forrest E. Norrod , Jimmy D. Pike , Michael Shepherd , Paul D. Stultz
- Applicant: Mukund P. Khatri , Forrest E. Norrod , Jimmy D. Pike , Michael Shepherd , Paul D. Stultz
- Applicant Address: US TX Round Rock
- Assignee: Dell Products L.P.
- Current Assignee: Dell Products L.P.
- Current Assignee Address: US TX Round Rock
- Agency: Baker Botts L.L.P.
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A system and method are herein disclosed for managing memory defects in an information handling system. More particularly, a system and method are described for generating a usable memory map which excludes memory locations containing defect memory elements. In an information handling system, a memory defect map, which contains information about the location of defective memory elements, is coupled to the memory device. As a map of memory usable by the system is created, usable memory regions containing defective memory elements are excluded from the memory map. The memory map is passed to the operating system, which uses only those regions of memory designated as usable and non-defective.
Public/Granted literature
- US20100251044A1 SYSTEM AND METHOD FOR USING A MEMORY MAPPING FUNCTION TO MAP MEMORY DEFECTS Public/Granted day:2010-09-30
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