发明授权
US08276029B2 System and method for using a memory mapping function to map memory defects
有权
使用内存映射函数映射内存缺陷的系统和方法
- 专利标题: System and method for using a memory mapping function to map memory defects
- 专利标题(中): 使用内存映射函数映射内存缺陷的系统和方法
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申请号: US12753406申请日: 2010-04-02
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公开(公告)号: US08276029B2公开(公告)日: 2012-09-25
- 发明人: Mukund P. Khatri , Forrest E. Norrod , Jimmy D. Pike , Michael Shepherd , Paul D. Stultz
- 申请人: Mukund P. Khatri , Forrest E. Norrod , Jimmy D. Pike , Michael Shepherd , Paul D. Stultz
- 申请人地址: US TX Round Rock
- 专利权人: Dell Products L.P.
- 当前专利权人: Dell Products L.P.
- 当前专利权人地址: US TX Round Rock
- 代理机构: Baker Botts L.L.P.
- 主分类号: G11C29/00
- IPC分类号: G11C29/00
摘要:
A system and method are herein disclosed for managing memory defects in an information handling system. More particularly, a system and method are described for generating a usable memory map which excludes memory locations containing defect memory elements. In an information handling system, a memory defect map, which contains information about the location of defective memory elements, is coupled to the memory device. As a map of memory usable by the system is created, usable memory regions containing defective memory elements are excluded from the memory map. The memory map is passed to the operating system, which uses only those regions of memory designated as usable and non-defective.
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