发明授权
- 专利标题： Radio frequency microscope for amplifying and analyzing electromagnetic signals by positioning the monitored system at a locus of an ellipsoidal surface
- 专利标题（中）： 射频显微镜，用于通过将监测的系统定位在椭圆面的轨迹上来放大和分析电磁信号
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申请号： US12473173申请日： 2009-05-27
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公开(公告)号： US08275738B2公开(公告)日： 2012-09-25
- 发明人: Kenny C. Gross , Ramakrishna C. Dhanekula , David K. McElfresh
- 申请人： Kenny C. Gross , Ramakrishna C. Dhanekula , David K. McElfresh
- 申请人地址： US CA Redwood Shores
- 专利权人： Oracle America, Inc.
- 当前专利权人： Oracle America, Inc.
- 当前专利权人地址： US CA Redwood Shores
- 代理机构： Park, Vaughan, Fleming & Dowler LLP
- 代理商 Chia-Hsin Suen
- 主分类号： G06F15/00
- IPC分类号： G06F15/00
摘要：
One embodiment provides a technique for analyzing a target electromagnetic signal radiating from a monitored system. During the technique, the monitored system is positioned at a first locus of an ellipsoidal surface to amplify the target electromagnetic signal received at a second locus of the ellipsoidal surface. Next, the amplified target electromagnetic signal is monitored using an antenna positioned at the second locus of the ellipsoidal surface. Finally, the integrity of the monitored system is assessed by analyzing the amplified target electromagnetic signal monitored by the antenna.
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