发明授权
- 专利标题： Power measurement techniques of a system-on-chip (SOC)
- 专利标题（中）： 片上系统（SOC）的功率测量技术
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申请号： US12557263申请日： 2009-09-10
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公开(公告)号： US08275560B2公开(公告)日： 2012-09-25
- 发明人: Sivakumar Radhakrishnan , Sin S. Tan , Stephan J. Jourdan , Lily P. Looi , Yi-Feng Liu
- 申请人： Sivakumar Radhakrishnan , Sin S. Tan , Stephan J. Jourdan , Lily P. Looi , Yi-Feng Liu
- 申请人地址： US CA Santa Clara
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 当前专利权人地址： US CA Santa Clara
- 代理机构： Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号： G01R15/00
- IPC分类号： G01R15/00 ; G01R19/00 ; G01R21/00 ; G06F1/00
摘要：
A method and system to enable power measurements of a system-on-chip in various modes. In one embodiment of the invention, the system-on-chip has full controllability of its logic and circuitry to facilitate configuration of the system-on-chip into a desired mode of operation. This allows hooks or interfaces to access the system-on-chip externally for measurements. For example, in one embodiment of the invention, the hooks in the system-on-chip allow a backend tester to configure the system-on-chip into various modes easily to perform power consumption measurements of one or more individual components of the system-on-chip. The power consumption measurement of the individual components in the system-on-chip can be performed faster and can be more accurate. In addition, the overall yield of the SOC can be increased as it is easier to detect failure parts.
公开/授权文献
- US20110060931A1 POWER MEASUREMENT TECHNIQUES OF A SYSTEM-ON-CHIP (SOC) 公开/授权日：2011-03-10
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