发明授权
- 专利标题: Magnetoelectric susceptibility measurement method and the system thereof
- 专利标题(中): 磁电磁测量方法及其系统
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申请号: US12441380申请日: 2007-10-05
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公开(公告)号: US08275427B2公开(公告)日: 2012-09-25
- 发明人: Kee hoon Kim , Yoon seok Oh
- 申请人: Kee hoon Kim , Yoon seok Oh
- 申请人地址: KR Seoul
- 专利权人: Seoul National University Industry Foundation
- 当前专利权人: Seoul National University Industry Foundation
- 当前专利权人地址: KR Seoul
- 优先权: KR10-2006-0123845 20061207
- 国际申请: PCT/KR2007/004860 WO 20071005
- 国际公布: WO2008/069423 WO 20080612
- 主分类号: G01R33/035
- IPC分类号: G01R33/035
摘要:
Disclosed herein is a method and system for measuring magnetoelectric susceptibility. The system includes a magnet supplying a DC magnetic bias to a magnetoelectric sample, an AC drive coil applying an AC magnetic field to the magnetoelectric sample, a charge amplifier amplifying an electric charge signal of the magnetoelectric sample oscillating by the AC magnetic field, and a phase sensitive detector detecting the voltage signal produced by the charge amplifier while supplying induction current to the AC drive coil. Accordingly, it is possible to provide a highly sensitive system for measuring magnetoelectric susceptibility, which is essential for research on multiferroic and magnetoelectric bulk and thin film materials at room temperature, and can also operate in the physical property measurement system (PPMS, manufactured by Quantum Design Co., Ltd.) for measurements under low temperature and high magnetic field environments.
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