发明授权
- 专利标题: Method for testing an electronics unit
- 专利标题(中): 电子单元测试方法
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申请号: US12311247申请日: 2007-10-02
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公开(公告)号: US08274295B2公开(公告)日: 2012-09-25
- 发明人: Udo Grittke , Axel Humpert , Dietmar Frühauf , Harald Schäuble
- 申请人: Udo Grittke , Axel Humpert , Dietmar Frühauf , Harald Schäuble
- 申请人地址: DE Maulburg
- 专利权人: Endress + Hauser GmbH + Co. KG
- 当前专利权人: Endress + Hauser GmbH + Co. KG
- 当前专利权人地址: DE Maulburg
- 代理机构: Bacon & Thomas, PLLC
- 优先权: DE102006047262 20061004
- 国际申请: PCT/EP2007/060481 WO 20071002
- 国际公布: WO2008/040744 WO 20080410
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.
公开/授权文献
- US20100164506A1 Method for testing an electronics unit 公开/授权日:2010-07-01
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