发明授权
- 专利标题: Strain measurement device and method of strain measurement using the same
- 专利标题(中): 应变测量装置及其应变测量方法
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申请号: US12850628申请日: 2010-08-05
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公开(公告)号: US08272273B2公开(公告)日: 2012-09-25
- 发明人: Lu-Zhuo Chen , Chang-Hong Liu , Jia-Ping Wang , Shou-Shan Fan
- 申请人: Lu-Zhuo Chen , Chang-Hong Liu , Jia-Ping Wang , Shou-Shan Fan
- 申请人地址: CN Beijing TW Tu-Cheng, New Taipei
- 专利权人: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址: CN Beijing TW Tu-Cheng, New Taipei
- 代理机构: Altis Law Group, Inc.
- 优先权: CN200910188746 20091204
- 主分类号: G01B7/16
- IPC分类号: G01B7/16
摘要:
A strain measurement device includes a strain gauge, a holding device, a transverse strain recorder, and a data processing device. The strain gauge includes at least one first and at least one second layers of carbon nanotube films, each layer of carbon nanotube films having a plurality of carbon nanotubes. The carbon nanotubes in at least one first layer of carbon nanotube film align along a first direction. The carbon nanotubes in at least one second layer of carbon nanotube film align along a second direction. The holding device is used to fasten a specimen and the strain gauge. The transverse strain recorder is used to record a transverse strain of the strain gauge. The data processing device is used to calculate an axial strain of the strain gauge.
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