发明授权
- 专利标题: Computer program and computer system for producing test flow
- 专利标题(中): 用于生产测试流程的计算机程序和计算机系统
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申请号: US12958350申请日: 2010-12-01
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公开(公告)号: US08271460B2公开(公告)日: 2012-09-18
- 发明人: Kazuhiko Iwasaki , Masayuki Arai , Kenichi Ichino
- 申请人: Kazuhiko Iwasaki , Masayuki Arai , Kenichi Ichino
- 申请人地址: JP Tokyo
- 专利权人: Silicon Test Technologies. Inc.
- 当前专利权人: Silicon Test Technologies. Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: Apex Juris, pllc
- 代理商 Tracy M. Heims
- 优先权: JP2009-272996 20091201
- 主分类号: G06F17/30
- IPC分类号: G06F17/30
摘要:
A program executed on a computer including storage, processing, output, and input units, the storage unit storing test-difficulty-calculation-elements-database, test-menu-database, and test-flow-database, for each test-menu-record, the program causing the processing unit to execute: calculating test-difficulty for each test-menu-record based on test-difficulty-calculation-formula by using at least one among pieces of information indicative of relationship with netlist, the number of package/test pins, expected operational clock frequency, process technology information, power consumption, and tester storage space; identifying all relationship between DFT scheme and priority, and causing the storage unit to store information indicative of the relationship between the DFT scheme and priority into the test-flow-database; and sorting the DFT scheme in an order of the priority based on the relationship between the DFT scheme and priority, causing the storage unit to store the DFT scheme as a test flow, and causing the output unit to output the test flow.
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