发明授权
- 专利标题: Evaluating high frequency time domain in embedded device probing
- 专利标题(中): 评估嵌入式设备探测中的高频时域
-
申请号: US13158519申请日: 2011-06-13
-
公开(公告)号: US08271220B2公开(公告)日: 2012-09-18
- 发明人: Joseph Curtis Diepenbrock , Roland Frech
- 申请人: Joseph Curtis Diepenbrock , Roland Frech
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Schmeiser, Olsen & Watts
- 代理商 Randall Bluestone
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known.
公开/授权文献
信息查询