Invention Grant
- Patent Title: Evaluating high frequency time domain in embedded device probing
- Patent Title (中): 评估嵌入式设备探测中的高频时域
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Application No.: US13158519Application Date: 2011-06-13
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Publication No.: US08271220B2Publication Date: 2012-09-18
- Inventor: Joseph Curtis Diepenbrock , Roland Frech
- Applicant: Joseph Curtis Diepenbrock , Roland Frech
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Schmeiser, Olsen & Watts
- Agent Randall Bluestone
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A system and associated method for evaluating a high-frequency signal at a point of interest on a signal path from a remote signal at a remote pickup point on the signal path. The point of interest is located on a device under test that is coupled to test equipment via the signal path. The high-frequency signal at the point of interest is calculated from the remote signal at the remote pickup point with an inverse transfer function that eliminates degradation effects on the high-frequency signal that is transferred through the signal path. The inverse transfer function may be calculated from measurements acquired in a test signal transfer through a reference path that simulates electrical properties of the signal path, or configured to a predetermined function if electrical properties of the signal path are known.
Public/Granted literature
- US20110238349A1 EVALUATING HIGH FREQUENCY TIME DOMAIN IN EMBEDDED DEVICE PROBING Public/Granted day:2011-09-29
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