发明授权
US08269952B2 Sample analyzer including a high frequency control component and sample analyzing method 有权
样品分析仪,包括高频控制组件和样品分析方法

  • 专利标题: Sample analyzer including a high frequency control component and sample analyzing method
  • 专利标题(中): 样品分析仪,包括高频控制组件和样品分析方法
  • 申请号: US12229783
    申请日: 2008-08-27
  • 公开(公告)号: US08269952B2
    公开(公告)日: 2012-09-18
  • 发明人: Kunio Ueno
  • 申请人: Kunio Ueno
  • 申请人地址: JP Kobe
  • 专利权人: Sysmex Corporation
  • 当前专利权人: Sysmex Corporation
  • 当前专利权人地址: JP Kobe
  • 代理机构: Brinks Hofer Gilson & Lione
  • 优先权: JP2007-219632 20070827
  • 主分类号: G01N33/48
  • IPC分类号: G01N33/48
Sample analyzer including a high frequency control component and sample analyzing method
摘要:
The present invention is to present a sample analyzer capable of automatically stabilizing the laser diode in multi-mode oscillation. A sample analyzer 1 comprises: a laser diode (LD) 501d for irradiating a sample with laser light; a photodiode (PD) 501e for detecting amount of light emitted from the LD 501d; a APC circuit 501b for outputting a direct current to be supplied to the LD 501d such that the amount of light emitted from the LD 501d is maintained at a predetermined amount, based on the amount of light detected by the PD 501e; a high frequency oscillation circuit 501f for superimposing a high frequency component on the direct current outputted from the APC circuit 501b; and a high frequency automatic adjustment circuit 501c for controlling amplitude of the high frequency component outputted from the high frequency oscillation circuit 501f according to magnitude of the direct current outputted from the APC circuit 501b such that the LD 501d oscillates in a multi-mode.
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