发明授权
- 专利标题: Mask and blank storage inner gas
- 专利标题(中): 面罩和空白存储内部气体
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申请号: US11733471申请日: 2007-04-10
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公开(公告)号: US08268541B2公开(公告)日: 2012-09-18
- 发明人: Cheng-Ming Lin , Chue San Yoo
- 申请人: Cheng-Ming Lin , Chue San Yoo
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: G03F7/20
- IPC分类号: G03F7/20
摘要:
The present disclosure provides a lithography apparatus. The lithography apparatus includes a radiation source providing a radiation energy with a wavelength selected from the group consisting of 193 nm, 248 nm, and 365 nm; a lens system configured approximate to the radiation source; a mask chamber proximate to the lens system, configured to hold a mask and operable to provide a single atom gas to the mask chamber; and a substrate stage configured to hold a substrate and receive the radiation energy through the lens system and the mask during an exposing process.
公开/授权文献
- US20080206683A1 MASK AND BLANK STORAGE INNER GAS 公开/授权日:2008-08-28
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