发明授权
- 专利标题: Test mode soft reset circuitry and methods
- 专利标题(中): 测试模式软复位电路和方法
-
申请号: US13159311申请日: 2011-06-13
-
公开(公告)号: US08266485B2公开(公告)日: 2012-09-11
- 发明人: Baojing Liu , Matt Davidson , Vladimir Kovalev
- 申请人: Baojing Liu , Matt Davidson , Vladimir Kovalev
- 申请人地址: US TX Plano
- 专利权人: SanDisk Technologies Inc.
- 当前专利权人: SanDisk Technologies Inc.
- 当前专利权人地址: US TX Plano
- 代理机构: Martine Penilla Group, LLP
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G06F11/00
摘要:
A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
公开/授权文献
- US20110246844A1 Test Mode Soft Reset Circuitry and Methods 公开/授权日:2011-10-06
信息查询