Invention Grant
- Patent Title: Detection system for birefringence measurement
- Patent Title (中): 双折射测量检测系统
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Application No.: US12442490Application Date: 2007-09-26
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Publication No.: US08248605B2Publication Date: 2012-08-21
- Inventor: Baoliang Wang
- Applicant: Baoliang Wang
- Applicant Address: US OR Hillsboro
- Assignee: Hinds Instruments, Inc.
- Current Assignee: Hinds Instruments, Inc.
- Current Assignee Address: US OR Hillsboro
- Agency: Hancock Hughey LLP
- International Application: PCT/US2007/079501 WO 20070926
- International Announcement: WO2008/039825 WO 20080403
- Main IPC: G01J4/00
- IPC: G01J4/00 ; G01B9/00 ; G01N21/41

Abstract:
A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary detector. The method includes the step selectively moving a lens into the path of the light beam for spreading the beam in instances where the path of the beam is altered by the sample between the source and the stationary detector The detector, therefore, is held stationary. Adjustment means are provided for increasing the intensity characteristic of the light that reaches the detector to account for a decrease in intensity that occurs when the lens is in the path of the light beam to spread the beam.
Public/Granted literature
- US20090279089A1 Detection System for Birefringence Measurement Public/Granted day:2009-11-12
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