发明授权
US08229064B2 Localization of an element of interest by XRF analysis of different inspection volumes
有权
通过XRF对不同检验量的分析来定位感兴趣的元素
- 专利标题: Localization of an element of interest by XRF analysis of different inspection volumes
- 专利标题(中): 通过XRF对不同检验量的分析来定位感兴趣的元素
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申请号: US12771646申请日: 2010-04-30
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公开(公告)号: US08229064B2公开(公告)日: 2012-07-24
- 发明人: Lee Grodzins
- 申请人: Lee Grodzins
- 申请人地址: US MA Tewksbury
- 专利权人: Thermo Scientific Portable Analytical Instruments Inc.
- 当前专利权人: Thermo Scientific Portable Analytical Instruments Inc.
- 当前专利权人地址: US MA Tewksbury
- 代理商 Gordon Stewart
- 主分类号: G01N23/223
- IPC分类号: G01N23/223
摘要:
An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.
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