Invention Grant
- Patent Title: Eddy current flaw detection probe
- Patent Title (中): 涡流探伤探头
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Application No.: US12128316Application Date: 2008-05-28
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Publication No.: US08228058B2Publication Date: 2012-07-24
- Inventor: Akira Nishimizu , Hirofumi Ouchi , Yoshio Nonaka , Yosuke Takatori , Akihiro Taki , Makoto Senoo
- Applicant: Akira Nishimizu , Hirofumi Ouchi , Yoshio Nonaka , Yosuke Takatori , Akihiro Taki , Makoto Senoo
- Applicant Address: JP Ibaraki
- Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee Address: JP Ibaraki
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2007-142428 20070529
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01N27/82

Abstract:
Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.
Public/Granted literature
- US20090009162A1 EDDY CURRENT FLAW DETECTION PROBE Public/Granted day:2009-01-08
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