Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US12320771Application Date: 2009-02-04
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Publication No.: US08218127B2Publication Date: 2012-07-10
- Inventor: Hiroyuki Nagasaka , Takeshi Okuyama
- Applicant: Hiroyuki Nagasaka , Takeshi Okuyama
- Applicant Address: JP Tokyo JP Yokohama-shi
- Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee: Nikon Corporation,Nikon Engineering Co., Ltd.
- Current Assignee Address: JP Tokyo JP Yokohama-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2003-272617 20030709
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52

Abstract:
An exposure apparatus exposes a substrate by forming a liquid immersion region on the substrate, and projecting a pattern image onto the substrate via a projection optical system and a liquid that forms the liquid immersion region. The exposure apparatus includes a projection optical system having a plurality of optical elements, by which a pattern image is projected onto a substrate via a liquid to expose the substrate and a liquid recovery system that recovers the liquid along with a gas and has a separator that separates the recovered liquid and the recovered gas.
Public/Granted literature
- US20090153820A1 Exposure apparatus and device manufacturing method Public/Granted day:2009-06-18
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