Techniques for non-invasive, post-silicon characterization of signal propagation delay/timing of devices in an integrated circuit (IC) are generally disclosed. A system of equations may be developed based on a plurality of sensitizable signal paths (SSPs) of the IC for characterizing signal propagation delay or timing of devices within the SSPs. Input Vectors (IVs) may be selected and consecutively applied at one or more input sequential element devices of the IC associated with the SSPs with to produce corresponding output values at one or more output sequential element devices of the IC associated with the SSPs. Various pre-processing and post-processing techniques may be practiced to further improve accuracy of solution of the equations to enable efficient determination of solutions. Example techniques may include variable splitting, device clustering, IV and equation selection, and boosting, among others. Other aspects may also be disclosed and claimed.