发明授权
- 专利标题： Apparatus for inspecting defects of honeycomb structure
- 专利标题（中）： 检测蜂窝结构缺陷的装置
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申请号： US12403599申请日： 2009-03-13
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公开(公告)号： US08174689B2公开(公告)日： 2012-05-08
- 发明人: Takayoshi Akao , Hiroyuki Shindo , Jun Inoue , Keita Oikawa
- 申请人： Takayoshi Akao , Hiroyuki Shindo , Jun Inoue , Keita Oikawa
- 申请人地址： JP Nagoya
- 专利权人： NGK Insulators, Ltd.
- 当前专利权人： NGK Insulators, Ltd.
- 当前专利权人地址： JP Nagoya
- 代理机构： Burr & Brown
- 优先权： JP2008-073017 20080321; JP2009-058746 20090311
- 主分类号： B01D46/00
- IPC分类号： B01D46/00 ; G01N21/00
摘要：
According to an apparatus for inspecting defects of a honeycomb structure that is provided with a current plate and an air current formation means (air source and a header tube), fine defects or defects taking place in the vicinity of an outer periphery of the honeycomb structure can be detected with high sensitivity.
公开/授权文献
- US20090237652A1 APPARATUS FOR INSPECTING DEFECTS OF HONEYCOMB STRUCTURE 公开/授权日：2009-09-24
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