发明授权
- 专利标题: Integrated circuit structures with multiple FinFETs
- 专利标题(中): 具有多个FinFET的集成电路结构
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申请号: US11807652申请日: 2007-05-30
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公开(公告)号: US08174073B2公开(公告)日: 2012-05-08
- 发明人: Tsung-Lin Lee , Chang-Yun Chang , Sheng-Da Liu , Fu-Liang Yang
- 申请人: Tsung-Lin Lee , Chang-Yun Chang , Sheng-Da Liu , Fu-Liang Yang
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L27/12
- IPC分类号: H01L27/12
摘要:
A semiconductor structure includes a semiconductor substrate; and a first Fin field-effect transistor (FinFET) and a second FinFET at a surface of the semiconductor substrate. The first FinFET includes a first fin; and a first gate electrode over a top surface and sidewalls of the first fin. The second FinFET includes a second fin spaced apart from the first fin by a fin space; and a second gate electrode over a top surface and sidewalls of the second fin. The second gate electrode is electrically disconnected from the first gate electrode. The first and the second gate electrodes have a gate height greater than about one half of the fin space.
公开/授权文献
- US20080296702A1 Integrated circuit structures with multiple FinFETs 公开/授权日:2008-12-04
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