发明授权
- 专利标题: Simulating two-dimensional periodic patterns using compressed fourier space
- 专利标题(中): 使用压缩傅立叶空间模拟二维周期模式
-
申请号: US12430805申请日: 2009-04-27
-
公开(公告)号: US08170838B2公开(公告)日: 2012-05-01
- 发明人: Silvio J. Rabello , William A. McGahan , Jie Li
- 申请人: Silvio J. Rabello , William A. McGahan , Jie Li
- 申请人地址: US CA Milpitas
- 专利权人: Nanometrics Incorporated
- 当前专利权人: Nanometrics Incorporated
- 当前专利权人地址: US CA Milpitas
- 代理机构: Silicon Valley Patent Group LLP
- 主分类号: H03F1/26
- IPC分类号: H03F1/26 ; G06F15/00
摘要:
The process of modeling a complex two-dimensional periodic structure is improved by selectively truncating the Fourier expansion used in the calculation of resulting scatter signature from the model. The Fourier expansion is selectively truncated by determining the contribution for each harmonic order in the Fourier transform of the permittivity function and retaining the harmonic orders with a contribution that is above a threshold. The Fourier space may be compressed so that only the selected harmonic orders are used, thereby reducing the required memory and calculation times. The compressed Fourier space may be used in a real-time analysis of a sample or to generate a library that is used in the analysis of a sample.
公开/授权文献
信息查询