Invention Grant
- Patent Title: X-ray inspection apparatus
- Patent Title (中): X光检查仪
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Application No.: US12548496Application Date: 2009-08-27
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Publication No.: US08155894B2Publication Date: 2012-04-10
- Inventor: Takashi Kabumoto
- Applicant: Takashi Kabumoto
- Applicant Address: JP Kyoto
- Assignee: Ishida Co., Ltd.
- Current Assignee: Ishida Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2008-220434 20080828
- Main IPC: G01B15/00
- IPC: G01B15/00 ; G06F19/00

Abstract:
An X-ray inspection apparatus includes a storage device, a setting device, a determining device, a calculating device and a display control device. The setting device is configured to set a hypothetical reference value that is different from an actual reference value that was used during the inspection of the articles. The determining device is configured to determine whether a contaminant exists inside each of the articles based on a result of a comparison between the hypothetical reference value and each of detection data stored in the storage device. The calculating device is configured to calculate a hypothetical contaminant existence rate as a ratio of a number of the articles in which the determining device has determined that a contaminant exists with respect to a total number of the articles. The display control device is configured to control a display section to indicate the hypothetical contaminant existence rate.
Public/Granted literature
- US20100057380A1 X-RAY INSPECTION APPARATUS Public/Granted day:2010-03-04
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