发明授权
- 专利标题: Unit for predicting malfunction of an apparatus
- 专利标题(中): 用于预测设备故障的单元
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申请号: US12869122申请日: 2010-08-26
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公开(公告)号: US08140916B2公开(公告)日: 2012-03-20
- 发明人: Taro Shibagaki , Satoru Nunokawa , Masaki Kato
- 申请人: Taro Shibagaki , Satoru Nunokawa , Masaki Kato
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- 优先权: JP2009-255310 20091106; JP2010-179021 20100809
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
According to one embodiment, a malfunction predicting unit includes a level reduction unit, a first buffer gate unit, a second buffer gate unit, a comparator unit and a processing unit. The level reduction unit reduces an input digital signal to generate a level-reduced signal. The first buffer gate unit generates a first output signal. The first output signal has first or second level if the digital signal is or is not higher than a preset threshold level, respectively. The second buffer gate unit generates a second output signal. The second output signal has the first or second level if the level-reduced signal is or is not higher than the preset threshold level, respectively. The comparator unit compares the first and second output signals to generate a comparison result. The processing unit determines whether a malfunction will soon occur, based on the comparison result.
公开/授权文献
- US20110113289A1 UNIT FOR PREDICTING MALFUNCTION OF AN APPARATUS 公开/授权日:2011-05-12
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