Invention Grant
US08134355B2 Semiconductor device and RFID tag using the semiconductor device
有权
使用半导体器件的半导体器件和RFID标签
- Patent Title: Semiconductor device and RFID tag using the semiconductor device
- Patent Title (中): 使用半导体器件的半导体器件和RFID标签
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Application No.: US12571938Application Date: 2009-10-01
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Publication No.: US08134355B2Publication Date: 2012-03-13
- Inventor: Hiroki Inoue , Kei Takahashi
- Applicant: Hiroki Inoue , Kei Takahashi
- Applicant Address: JP
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP
- Agency: Husch Blackwell LLP
- Priority: JP2008-257008 20081002
- Main IPC: G05F3/26
- IPC: G05F3/26 ; G05F3/28

Abstract:
A semiconductor device monitors a voltage between a reference potential and an input potential and obtains a constant output potential regardless of a value of the voltage, after the voltage exceeds a predetermined threshold voltage in such a manner that the semiconductor device divides a voltage between the reference potential and the input potential using a plurality of first non-linear elements and at least one linear element to constantly generate a first bias voltage regardless of a value of the voltage, divides a voltage between the reference potential and the input potential using a plurality of second non-linear elements with reference to the first bias voltage to constantly generate a second bias voltage regardless of a value of the voltage, and determines the output potential with reference to the second bias voltage.
Public/Granted literature
- US20100085030A1 Semiconductor Device and RFID Tag Using the Semiconductor Device Public/Granted day:2010-04-08
Information query
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