发明授权
- 专利标题: Schottky device and process of making the same comprising a geometry gap
- 专利标题(中): 肖特基器件及其制造方法包括几何间隙
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申请号: US11601131申请日: 2006-11-17
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公开(公告)号: US08125008B2公开(公告)日: 2012-02-28
- 发明人: Chiu-Chih Chiang , Chih-Feng Huang , You-Kuo Wu , Long Shih Lin
- 申请人: Chiu-Chih Chiang , Chih-Feng Huang , You-Kuo Wu , Long Shih Lin
- 申请人地址: TW Taipei
- 专利权人: System General Corporation
- 当前专利权人: System General Corporation
- 当前专利权人地址: TW Taipei
- 代理机构: Skaar Ulbrich Macari, P.A.
- 主分类号: H01L29/66
- IPC分类号: H01L29/66
摘要:
A Schottky device and a semiconductor process of making the same are provided. The Schottky device comprises a substrate, a deep well, a Schottky contact, and an Ohmic contact. The substrate is doped with a first type of ions. The deep well is doped with a second type of ions, and formed in the substrate. The Schottky contact contacts a first electrode with the deep well. The Ohmic contact contacts a second electrode with a heavily doped region with the second type of ions in the deep well. Wherein the deep well has a geometry gap with a width formed under the Schottky contact, the first type of ions and the second type of ions are complementary, and the width of the gap adjusts the breakdown voltage.
公开/授权文献
- US20080116539A1 Schottky device and process of making the same 公开/授权日:2008-05-22
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