发明授权
US08111402B2 Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
有权
基于光学谐振器传感器和干涉测量传感器中重叠光学模式的光学感测
- 专利标题： Optical sensing based on overlapping optical modes in optical resonator sensors and interferometric sensors
- 专利标题（中）： 基于光学谐振器传感器和干涉测量传感器中重叠光学模式的光学感测
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申请号： US12418525申请日： 2009-04-03
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公开(公告)号： US08111402B2公开(公告)日： 2012-02-07
- 发明人: Thanh M. Le , Nan Yu , Lutfollah Maleki , Anatoliy Savchenkov , William H. Steier
- 申请人： Thanh M. Le , Nan Yu , Lutfollah Maleki , Anatoliy Savchenkov , William H. Steier
- 申请人地址： US CA Pasadena US CA Pasadena US CA Los Angeles
- 专利权人： OEwaves, Inc.,California Institute of Technology,University of Southern California
- 当前专利权人： OEwaves, Inc.,California Institute of Technology,University of Southern California
- 当前专利权人地址： US CA Pasadena US CA Pasadena US CA Los Angeles
- 代理机构： Perkins Coie LLP
- 主分类号： G01B9/02
- IPC分类号： G01B9/02
摘要：
Techniques and devices based on transverse magnetic (TM) and transverse electric (TE) modes in an optical resonator or interferometer to provide sensitive optical detection with insensitivity to a change in temperature. A shift in a difference between a first resonance wavelength of a TE optical mode and a second resonance wavelength of a TM optical mode is measured to measure a change in a sample that is in optical interaction with the optical resonator or interferometer. For example, the detected shift can be used to measure a change in a refractive index of the sample.
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