发明授权
- 专利标题: Nonvolatile semiconductor memory device and method for manufacturing same
- 专利标题(中): 非易失性半导体存储器件及其制造方法
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申请号: US12535847申请日: 2009-08-05
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公开(公告)号: US08084807B2公开(公告)日: 2011-12-27
- 发明人: Megumi Ishiduki , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yosuke Komori , Masaru Kito , Yoshiaki Fukuzumi , Hideaki Aochi
- 申请人: Megumi Ishiduki , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yosuke Komori , Masaru Kito , Yoshiaki Fukuzumi , Hideaki Aochi
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2008-210450 20080819
- 主分类号: H01L29/792
- IPC分类号: H01L29/792
摘要:
A multilayer body is formed by alternately stacking electrode films serving as control gates and dielectric films in a direction orthogonal to an upper surface of a silicon substrate. Trenches extending in the word line direction are formed in the multilayer body and a memory film is formed on an inner surface of the trench. Subsequently, a silicon body is buried inside the trench, and a charge storage film and the silicon body are divided in the word line direction to form silicon pillars. This simplifies the configuration of memory cells in the bit line direction, and hence can shorten the arrangement pitch of the silicon pillars, decreasing the area per memory cell.
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