发明授权
US08069026B2 Clock gating analyzing apparatus, clock gating analyzing method, and computer product 有权
时钟选通分析装置,时钟选通分析方法和计算机产品

  • 专利标题: Clock gating analyzing apparatus, clock gating analyzing method, and computer product
  • 专利标题(中): 时钟选通分析装置,时钟选通分析方法和计算机产品
  • 申请号: US12002349
    申请日: 2007-12-17
  • 公开(公告)号: US08069026B2
    公开(公告)日: 2011-11-29
  • 发明人: Hiroyuki Higuchi
  • 申请人: Hiroyuki Higuchi
  • 申请人地址: JP Kawasaki
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: JP Kawasaki
  • 代理机构: Greer, Burns & Crain, Ltd.
  • 优先权: JP2007-032540 20070213
  • 主分类号: G06F17/50
  • IPC分类号: G06F17/50
Clock gating analyzing apparatus, clock gating analyzing method, and computer product
摘要:
Clock gating analysis of a target circuit having a plurality of clock gates, involves the calculation of a clock gate function for each of the clock gates. The clock gate functions indicate an activation state of the clock gates and a combination of output values from sequential circuit elements in the target circuit are substituted into each of the clock gate functions to obtained clock gate function values. Combinations of the clock gate function values form individual clock gating states. Each clock gating state indicates an activation state of each of the local clocks, collectively. A table indicating correlations between the combinations of output values and the clock gating states is generated and from the conversion table, a group that includes all of the clock gating states possible is output.
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