发明授权
- 专利标题: Eyeglass frame shape measurement apparatus
- 专利标题(中): 眼镜架形状测量仪
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申请号: US12963082申请日: 2010-12-08
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公开(公告)号: US08015716B2公开(公告)日: 2011-09-13
- 发明人: Yoshinori Matsuyama
- 申请人: Yoshinori Matsuyama
- 申请人地址: JP Aichi
- 专利权人: Nidek Co., Ltd.
- 当前专利权人: Nidek Co., Ltd.
- 当前专利权人地址: JP Aichi
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2009-279942 20091209
- 主分类号: G01B5/20
- IPC分类号: G01B5/20
摘要:
An apparatus for measuring a shape of an eyeglass frame, includes: a tracing stylus moving unit that includes a tracing stylus detecting a position of a rim of the frame in a moving radius direction and in a vertical direction, a tracing stylus shaft for the tracing stylus, a holding unit configured to vertically-movably hold the tracing stylus shaft, a vertical direction moving unit for moving the holding unit in the vertical direction, and a moving radius direction moving unit for moving the holding unit in the moving radius direction so that the tracing stylus traces the rim; a vertical position detection unit for detecting a position of the tracing stylus in the vertical direction; and a controller for obtaining a next measurement position of the holding unit in the vertical direction based on the detecting result of the vertical position detection unit, and controls the vertical direction moving unit.
公开/授权文献
- US20110131823A1 EYEGLASS FRAME SHAPE MEASUREMENT APPARATUS 公开/授权日:2011-06-09
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