Invention Grant
US08010309B2 On-site analysis system with central processor and method of analyzing
有权
具有中央处理器的现场分析系统和分析方法
- Patent Title: On-site analysis system with central processor and method of analyzing
- Patent Title (中): 具有中央处理器的现场分析系统和分析方法
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Application No.: US12914866Application Date: 2010-10-28
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Publication No.: US08010309B2Publication Date: 2011-08-30
- Inventor: Alan P. Lundstedt , Allen L. Hall , Ching-Hui Tseng
- Applicant: Alan P. Lundstedt , Allen L. Hall , Ching-Hui Tseng
- Applicant Address: DE Duesseldorf
- Assignee: Cognis IP Management GmbH
- Current Assignee: Cognis IP Management GmbH
- Current Assignee Address: DE Duesseldorf
- Agency: Diehl Servilla LLC
- Main IPC: G06F17/10
- IPC: G06F17/10

Abstract:
A method of analysis, analysis system, program product, apparatus, and method of supplying analysis of value incorporating the use of at least one data acquisition device, a central processor, and a communication link that is connectable between the data acquisition device and the central processor. The central processor is loaded with multivariate calibration models developed for predicting values for various properties of interest, wherein the calibration models are capable of compensating for variations in an effectively comprehensive set of measurement conditions and secondary material characteristics. As so configured, the calibration models can compensate for instrument variance without instrument-specific calibration transfer. Measurement results generated by the central processor can be transmitted to an output device of a user interface.
Public/Granted literature
- US20110054864A1 ON-SITE ANALYSIS SYSTEM WITH CENTRAL PROCESSOR AND METHOD OF ANALYZING Public/Granted day:2011-03-03
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