发明授权
- 专利标题： Method and system for the calculation of the sensitivities of an electrical parameter of an integrated circuit
- 专利标题（中）： 用于计算集成电路电参数灵敏度的方法和系统
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申请号： US12059163申请日： 2008-03-31
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公开(公告)号： US07979825B2公开(公告)日： 2011-07-12
- 发明人: Ibrahim M. Elfadel , Tarek A. El Moselhy
- 申请人： Ibrahim M. Elfadel , Tarek A. El Moselhy
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Harrington & Smith
- 主分类号： G06F9/455
- IPC分类号： G06F9/455
摘要：
A method and system for determining electrical parameter data for a layer of an integrated circuit that can include a nominal electrical parameter value, and sensitivity values which represent the sensitivities of the nominal electrical parameter value to variations in the nominal parameter values. A template of the layer geometry is provided from a portion of which a set of linear equations are developed and which equations are solved using a two step method and from which solution the nominal electrical parameter values are determined. An auxiliary set of the original linear equations is developed from the original set using the adjoint method and from the solution of the auxiliary set using the two step method the sensitivity values are calculated.
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