发明授权
- 专利标题: Multi-phase interferometer
- 专利标题(中): 多相干涉仪
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申请号: US12463727申请日: 2009-05-11
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公开(公告)号: US07978316B2公开(公告)日: 2011-07-12
- 发明人: Avraham Aharoni
- 申请人: Avraham Aharoni
- 申请人地址: IL Technion, Haifa
- 专利权人: Technion Research & Development Foundation Ltd.
- 当前专利权人: Technion Research & Development Foundation Ltd.
- 当前专利权人地址: IL Technion, Haifa
- 代理机构: Kilpatrick Townsend & Stockton LLP
- 优先权: IL179204 20061113
- 主分类号: G01B9/02
- IPC分类号: G01B9/02
摘要:
An optical perturbation sensing system includes a probing beam incident on a medium with perturbations and a sensing beam redirected from the medium and incident on a surface area of a photodetector. A reference beam directed onto the photodetector surface forms, with the sensing beam, an interference pattern on the photodetector surface and a phase patterner with at least two phase regions across its section, generates different phases in different regions of the interference pattern. An array of photodetector elements detects each phase region of the interference pattern and a constructive combiner subtract pairs of the detected signals, squares the subtracted signal squares, and sums the squared signals to form a stronger detected signal with reduced intensity noise, reduced background noise, and reduced sensitivity to phase drifts.
公开/授权文献
- US20090213385A1 Multi-Phase Interferometer 公开/授权日:2009-08-27
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