发明授权
- 专利标题: Registration detection system
- 专利标题(中): 注册检测系统
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申请号: US11661418申请日: 2005-10-17
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公开(公告)号: US07974804B2公开(公告)日: 2011-07-05
- 发明人: Makoto Takagi
- 申请人: Makoto Takagi
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Arent Fox LLP
- 优先权: JP2004-310917 20041026
- 国际申请: PCT/JP2005/019058 WO 20051017
- 国际公布: WO2006/046429 WO 20060504
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
A registration detection system realizes both substrate-by-substrate correction and highly accurate correction of an exposure process. Therefore, the registration detection system includes: the first detection apparatus installed on a pathway to a collection in a transport container of substrates taken out of the transport container, after passing at least an exposure process and a development process, registration-detects the substrates after passing the development process at multiple points; the second detection apparatus outside the pathway, and performing registration-detecting the substrates at more points than the first detection apparatus when the substrates after passing the first detection apparatus and collected in the transport container are taken out from the transport container again; and a generation unit (image processing parts of the aforementioned detection apparatuses) that generates compensation data for the exposure process based on detection results by the first detection apparatus and detection results by the second detection apparatus.
公开/授权文献
- US20080215275A1 Overlay Inspection System 公开/授权日:2008-09-04
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