发明授权
- 专利标题: Analysis system
- 专利标题(中): 分析系统
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申请号: US12723009申请日: 2010-03-12
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公开(公告)号: US07949496B2公开(公告)日: 2011-05-24
- 发明人: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- 申请人: Stefan Lindberg , Hakan Hedlund , Jim Kummelstam , Jarl-Ove Lindberg
- 申请人地址: SE Strangnas
- 专利权人: SPM Instrument AB
- 当前专利权人: SPM Instrument AB
- 当前专利权人地址: SE Strangnas
- 代理机构: Young & Thompson
- 优先权: SE0200147 20020118; SE0200215 20020125
- 主分类号: G06F11/30
- IPC分类号: G06F11/30
摘要:
An apparatus for analyzing the condition of a machine having a rotating shaft, comprising: at least one input for receiving measurement data from a sensor for surveying a measuring point of the machine, the measurement data being dependent on rotation of the shaft; a data processor for processing condition data dependent on the measurement data; the data processor performing a plurality of condition monitoring functions (F1, F2 Fn). At least one of the plurality of condition monitoring functions (F1, F2 Fn) is a restricted function having a disabled state and an enabled state; the disabled state prohibiting complete execution of the condition monitoring function, and the enabled sate allowing execution. The apparatus allows a limited amount of use of the at least one restricted condition monitoring function; and at least one of the plurality of condition monitoring functions (F1, F2, Fn) is an unrestricted function.
公开/授权文献
- US20100169047A1 ANALYSIS SYSTEM 公开/授权日:2010-07-01
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