发明授权
- 专利标题: Graphical analysis to detect process object anomalies
- 专利标题(中): 用于检测过程对象异常的图形分析
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申请号: US11613413申请日: 2006-12-20
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公开(公告)号: US07926026B2公开(公告)日: 2011-04-12
- 发明人: Udo Klein , Thomas Wieczorek , Daniel Zimmermann , Oliver Sievi , Guenter Pecht-Seibert
- 申请人: Udo Klein , Thomas Wieczorek , Daniel Zimmermann , Oliver Sievi , Guenter Pecht-Seibert
- 申请人地址: DE Walldorf
- 专利权人: SAP AG
- 当前专利权人: SAP AG
- 当前专利权人地址: DE Walldorf
- 代理机构: Kenyon & Kenyon LLP
- 主分类号: G06F9/44
- IPC分类号: G06F9/44
摘要:
A method and system for graphical analysis to detect anomalies in process objects. The method generates a graph to represent a set of process objects, applies a clustering algorithm to cluster like nodes of the graph, compares the clusters to the process objects, and, if the objects match the clusters, accepts the objects for further review or for use in applications. If one or more of the objects do not match the clusters, such suggests that there are anomalies in the process objects requiring correction. An example implementation may be to detect anomalies in the design of the process objects.
公开/授权文献
- US20080155335A1 GRAPHICAL ANALYSIS TO DETECT PROCESS OBJECT ANOMALIES 公开/授权日:2008-06-26
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