发明授权
- 专利标题: Quality control system, analyzer, and quality control method
- 专利标题(中): 质量控制体系,分析仪和质量控制方法
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申请号: US11903364申请日: 2007-09-21
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公开(公告)号: US07925461B2公开(公告)日: 2011-04-12
- 发明人: Tadayuki Yamaguchi , Atsushi Shirakami , Etsuro Shinkai , Yasuhiro Ochi
- 申请人: Tadayuki Yamaguchi , Atsushi Shirakami , Etsuro Shinkai , Yasuhiro Ochi
- 申请人地址: JP Kobe
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP Kobe
- 代理机构: Brinks Hofer Gilson & Lione
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
A quality control method using a plurality of analyzers and a control device connected to the analyzers via a network, the method comprising: (a) measuring quality control samples by the analyzers; (b) collecting a plurality of quality control data obtained by measuring the quality control samples; (c) implementing a quality control by the control device based on the collected quality control data; (d) obtaining uncertainty of measurement of analyzer based on uncertainty of analyzer calibration and the quality control data; (e) outputting a result of the quality control; and (f) outputting the uncertainty of measurement is disclosed. A quality control system and an analyzer are also disclosed.
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