发明授权
- 专利标题： Feature point detecting device, feature point detecting method, and feature point detecting program
- 专利标题（中）： 特征点检测装置，特征点检测方法和特征点检测程序
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申请号： US11717139申请日： 2007-03-13
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公开(公告)号： US07925048B2公开(公告)日： 2011-04-12
- 发明人: Koichi Kinoshita
- 申请人： Koichi Kinoshita
- 申请人地址： JP Kyoto
- 专利权人： Omron Corporation
- 当前专利权人： Omron Corporation
- 当前专利权人地址： JP Kyoto
- 代理机构： Dickstein Shapiro LLP
- 优先权： JP2006-068047 20060313
- 主分类号： G06K9/00
- IPC分类号： G06K9/00
摘要：
A device and method for detecting feature points of an object from an image. A three-dimensional model is created in which a plurality of nodes corresponding to feature points in a learning image are defined. The model is projected onto an input image and a feature value is derived from a plurality of sampling points around a projection point of each node. An error estimated amount is computed based on the displacement of a feature point between a correct model and an error model. The three dimensional position of each feature point in the input image is estimated based on the error estimated amount and a three dimensional model.
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