发明授权
US07924018B2 MEMS electrometer that measures amount of repulsion of adjacent beams from each other for static field detection 有权
MEMS静电计,用于测量相邻光束相对于静态场检测的排斥量

MEMS electrometer that measures amount of repulsion of adjacent beams from each other for static field detection
摘要:
An apparatus for detecting a static field includes a microelectromechanical systems (MEMS) device having two cantilevered beams of conductive material that are adjacent and substantially parallel to each other. The two beams repel each other in the presence of a static field. At least one sensor detects a respective amount of displacement of the two cantilevered beams from a rest position and determines an amount of repulsion of the two cantilevered beams from each other.
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