发明授权
- 专利标题: X-ray apparatus with an x-ray source and an x-ray detector
- 专利标题(中): 具有X射线源和X射线检测器的X射线装置
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申请号: US11803510申请日: 2007-05-15
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公开(公告)号: US07914206B2公开(公告)日: 2011-03-29
- 发明人: Michael Diez
- 申请人: Michael Diez
- 申请人地址: DE Munich
- 专利权人: Siemens Aktiengesellschart
- 当前专利权人: Siemens Aktiengesellschart
- 当前专利权人地址: DE Munich
- 优先权: DE102006023211 20060517
- 主分类号: A61B6/08
- IPC分类号: A61B6/08
摘要:
The invention relates to an x-ray apparatus with an x-ray source and an x-ray detector, with the x-ray source able to be moved in a first plane and the x-ray detector in a second plane parallel to the first plane and not coinciding with the first plane, with the x-ray source and the x-ray detector always able to be aligned to one another, and a object under examination being able to be arranged between the first plane and the second plane, with, by means of a movement of the x-ray source and a movement of the x-ray detector adapted to the movement of the x-ray source, as well as by means of x-rays leaving the x-ray source, penetrating the object under examination and detected by the x-ray detector, a plurality of two-dimensional projections of the object under examination being able to be recorded in different projection directions relative to the object under examination, from which a spatial presentation of the object under examination is able to be determined.
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