发明授权
- 专利标题： Contour measuring probe
- 专利标题（中）： 轮廓测量探头
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申请号： US12648474申请日： 2009-12-29
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公开(公告)号： US07913412B2公开(公告)日： 2011-03-29
- 发明人: Fa-Ping Xia
- 申请人： Fa-Ping Xia
- 申请人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 代理商 Clifford O. Chi
- 优先权： CN200910300541 20090225
- 主分类号： G01B5/20
- IPC分类号： G01B5/20
摘要：
A contour measuring probe includes an air guide, a sliding member and a probe tip. The air guide defines a guide hole. The sliding member is slidably received in the guide hole. The probe tip is fixed on an end of the sliding member. A cross-section of the sliding member is non-circular, and the guide hole is a non-circular hole, such that the sliding member slides only along an axis of the air guide.
公开/授权文献
- US20100212174A1 CONTOUR MEASURING PROBE 公开/授权日：2010-08-26
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