发明授权
- 专利标题： Method of determining measurement uncertainties using circuit simulation
- 专利标题（中）： 使用电路仿真确定测量不确定度的方法
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申请号： US10783645申请日： 2004-02-20
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公开(公告)号： US07848911B2公开(公告)日： 2010-12-07
- 发明人: Daniel L. Plesant
- 申请人： Daniel L. Plesant
- 申请人地址： US CA Santa Clara
- 专利权人： Agilent Technologies, Inc.
- 当前专利权人： Agilent Technologies, Inc.
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
A method of determining a measurement uncertainty of a test system uses a test system model having a plurality of uncertainty terms entered into a simulator. The test system model is run on the simulator a sufficient number of iterations while randomly varying each of a first portion of the plurality of uncertainty terms within probability distributions to produce a statistically significant number of results of a selected parameter. The results are evaluated to determine a measurement uncertainty of the selected parameter.
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