发明授权
- 专利标题: 3D image measuring apparatus and method thereof
- 专利标题(中): 3D图像测量装置及其方法
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申请号: US11637040申请日: 2006-12-12
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公开(公告)号: US07830528B2公开(公告)日: 2010-11-09
- 发明人: Kwangill Koh , Eun Hyoung Seong , Moon Young Jeon , Min Young Kim , Seung Jun Lee
- 申请人: Kwangill Koh , Eun Hyoung Seong , Moon Young Jeon , Min Young Kim , Seung Jun Lee
- 申请人地址: KR Seoul
- 专利权人: Koh Young Technology, Inc.
- 当前专利权人: Koh Young Technology, Inc.
- 当前专利权人地址: KR Seoul
- 代理机构: Kile Park Goekjian Reed & McManus PLLC
- 代理商 Jae Y. Park
- 优先权: KR10-2005-0123409 20051214; KR10-2005-0123412 20051214
- 主分类号: G01B11/24
- IPC分类号: G01B11/24
摘要:
A three dimensional (3D) measuring apparatus and method are provided. The 3D image measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which controls the first and the second lattices through a predetermined number of movement actions during operation of the measuring apparatus.
公开/授权文献
- US20070133011A1 3D image measuring apparatus and method thereof 公开/授权日:2007-06-14
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