发明授权
US07830522B2 Method and apparatus for determining reflectance data of a subject
有权
用于确定被检体的反射率数据的方法和装置
- 专利标题： Method and apparatus for determining reflectance data of a subject
- 专利标题（中）： 用于确定被检体的反射率数据的方法和装置
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申请号： US11705195申请日： 2007-02-12
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公开(公告)号： US07830522B2公开(公告)日： 2010-11-09
- 发明人: Jefferson Y. Han , Kenneth Perlin
- 申请人： Jefferson Y. Han , Kenneth Perlin
- 申请人地址： US NY New York
- 专利权人： New York University
- 当前专利权人： New York University
- 当前专利权人地址： US NY New York
- 代理商 Ansel M. Schwartz
- 主分类号： G01N21/47
- IPC分类号： G01N21/47 ; G01N21/55
摘要：
An apparatus for obtaining reflectance data of an object includes a diffuser having a surface. The apparatus includes a mapping portion that effects a mapping between a light field at the object's surface and a light field at the diffuser surface for BRDF capture of the object. A method for obtaining reflectance data usable to determine a plurality of values of the BRDF of an object. The method includes the steps of illuminating the object. There is the step of effecting a mapping between a light field at the object's surface and a light field at a diffuser surface for BRDF capture of the object with a mapping portion. An apparatus and a method for measuring an 8D reflectance field of an object or a 3D object.
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