发明授权
- 专利标题： Ducted test socket
- 专利标题（中）： 管道测试插座
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申请号： US12107404申请日： 2008-04-22
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公开(公告)号： US07830164B2公开(公告)日： 2010-11-09
- 发明人: Terry R. Earle , Timothy Pursel , Lance LeRoy Sundstrom
- 申请人： Terry R. Earle , Timothy Pursel , Lance LeRoy Sundstrom
- 申请人地址： US NJ Morristown
- 专利权人： Honeywell International Inc.
- 当前专利权人： Honeywell International Inc.
- 当前专利权人地址： US NJ Morristown
- 代理机构： Shumaker & Sieffert, P.A.
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
A ducted test socket for thermally testing a device under test (DUT) is provided that can accommodate a large DUT and will improve the thermal transfer efficiency between a precision temperature forcing system (PTFS) and the DUT. The ducted test socket comprises a carrier and a base with opposing, mated cavities and holes. These cavities and holes channel airflow around the entire DUT body and out outlet ports.
公开/授权文献
- US20090261852A1 Ducted Test Socket 公开/授权日：2009-10-22
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