Invention Grant
US07818327B2 Method and system for determining conformance of a data key with rules by means of memory lookups
有权
用于通过存储器查找来确定数据密钥与规则的一致性的方法和系统
- Patent Title: Method and system for determining conformance of a data key with rules by means of memory lookups
- Patent Title (中): 用于通过存储器查找来确定数据密钥与规则的一致性的方法和系统
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Application No.: US10526700Application Date: 2002-09-06
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Publication No.: US07818327B2Publication Date: 2010-10-19
- Inventor: Shridhar Mubaraq Mishra , Guruprasad Ardhanari
- Applicant: Shridhar Mubaraq Mishra , Guruprasad Ardhanari
- Applicant Address: DE Munich
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Munich
- Agency: Maginot, Moore, Beck
- International Application: PCT/SG02/00207 WO 20020906
- International Announcement: WO2004/023761 WO 20040318
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/30

Abstract:
A method of comparing unmasked bits of an N-bit data key to an N-bit Rule includes dividing the key into C-bit chunks. Each of the chunks is used as an 5 address to extract from memories 12, 13, 14, 21, 22, 23, 24, 31, 32, 33, 34, 41, 42, 43, 44. The memory is preprepared, such that the data stored in the address corresponding to that chunk of the key is 1 or O according to whether a bitwise comparison of that chunk of the data key with the mask is equal to a bitwise comparison of that chunk of the mask and rule. This extracted bit therefore indicates whether the rule is obeyed for that chunk of the data key. The N/C extracted bits for each rule are compared, to determine if the rule is obeyed for the entire data key.
Public/Granted literature
- US20050262127A1 Method and system for determining conformance of a data key with rules by means of memory lookups Public/Granted day:2005-11-24
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