Invention Grant
- Patent Title: Method for detecting the presence of high atomic number elements
- Patent Title (中): 用于检测高原子序数元素的存在的方法
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Application No.: US11756027Application Date: 2007-05-31
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Publication No.: US07809103B2Publication Date: 2010-10-05
- Inventor: Yanfeng Du , Forrest Frank Hopkins , Joseph Bendahan
- Applicant: Yanfeng Du , Forrest Frank Hopkins , Joseph Bendahan
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Joseph J. Christian
- Main IPC: G01N23/087
- IPC: G01N23/087
Abstract:
Disclosed herein is a method for detecting high atomic number elements in an article by using radiation having two different energies. The detecting of high atomic number elements can be accomplished by using an algorithm, curve fitting or using a data table. Disclosed herein too is a radiation system that uses the aforementioned method for detecting high atomic number elements.
Public/Granted literature
- US20100166142A1 METHOD FOR DETECTING THE PRESENCE OF HIGH ATOMIC NUMBER ELEMENTS Public/Granted day:2010-07-01
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