Invention Grant
US07807267B2 Method of modifying porous film, modified porous film and use of same
有权
改性多孔膜的方法,改性多孔膜及其用途
- Patent Title: Method of modifying porous film, modified porous film and use of same
- Patent Title (中): 改性多孔膜的方法,改性多孔膜及其用途
-
Application No.: US10526688Application Date: 2003-09-08
-
Publication No.: US07807267B2Publication Date: 2010-10-05
- Inventor: Kazuo Kohmura , Shunsuke Oike , Takeshi Kubota , Masami Murakami , Yoshito Kurano
- Applicant: Kazuo Kohmura , Shunsuke Oike , Takeshi Kubota , Masami Murakami , Yoshito Kurano
- Applicant Address: JP Tokyo
- Assignee: Mitsui Chemicals, Inc.
- Current Assignee: Mitsui Chemicals, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Turocy & Watson, LLP
- Priority: JP2002-262675 20020909; JP2003-067456 20030313
- International Application: PCT/JP03/11445 WO 20030908
- International Announcement: WO2004/026765 WO 20040401
- Main IPC: B32B9/04
- IPC: B32B9/04

Abstract:
The present invention relates to a method for modifying a porous film mainly having Si—O bonds wherein a thermal treatment is conducted without using a metal catalyst by bringing an organic silicon compound into contact with the porous film. The organic silicon compound includes one or more Si—X—Si bond unit (wherein X represents O, NR, CnH2n, or C6H4; R represents CmH2m+1 or C6H5; m is an integer between 1 and 6; and n is 1 or 2) and two or more Si-A bond units (wherein A represents H, OH, OCeH2e+1 or a halogen atom and can be the same or different within a single molecule; and e is an integer between 1 and 6). Since the porous film obtained by this method is excellent in the hydrophobic property and the mechanical strength, it can be used as an optically functional material or an electronically functional material. The porous film is especially useful as a semiconductor material, and can be preferably used as an interlayer insulating film in a semiconductor device.
Public/Granted literature
- US20060040110A1 Method of modifying porous film, modified porous film and use of same Public/Granted day:2006-02-23
Information query