发明授权
US07800960B2 Voltage generator for nonvolatile memory and writing and erasing method of nonvolatile memory
有权
非易失性存储器的电压发生器和非易失性存储器的写入和擦除方法
- 专利标题: Voltage generator for nonvolatile memory and writing and erasing method of nonvolatile memory
- 专利标题(中): 非易失性存储器的电压发生器和非易失性存储器的写入和擦除方法
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申请号: US12071765申请日: 2008-02-26
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公开(公告)号: US07800960B2公开(公告)日: 2010-09-21
- 发明人: Yasuhiro Tonda , Hidetoshi Ozoe , Hideaki Uemura , Junichi Yamada , Kenji Hibino , Tatsuya Saito
- 申请人: Yasuhiro Tonda , Hidetoshi Ozoe , Hideaki Uemura , Junichi Yamada , Kenji Hibino , Tatsuya Saito
- 申请人地址: JP Kawasaki, Kanagawa
- 专利权人: NEC Electronics Corporation
- 当前专利权人: NEC Electronics Corporation
- 当前专利权人地址: JP Kawasaki, Kanagawa
- 代理机构: McGinn IP Law Group, PLLC
- 优先权: JP2007-046527 20070227
- 主分类号: G11C5/14
- IPC分类号: G11C5/14
摘要:
A voltage generator for nonvolatile memory that generates an applied voltage to be applied to a nonvolatile memory includes a first voltage generator to generate a first voltage corresponding to the applied voltage, a reference voltage generator to generate a reference voltage, a comparator to compare the first voltage with the reference voltage and output a boost operation control signal according to a comparison result, and a booster to generate the applied voltage in a pulse-like voltage waveform by starting or stopping boost operation based on the boost operation control signal. The applied voltage corresponding to the first voltage upon inversion of the boost operation control signal is varied within one pulse-like voltage waveform by varying one of the first voltage and the reference voltage.
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